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High-temperature configurations of dimers in Si (001) surface layers

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dc.contributor.author Ків, Арнольд Юхимович
dc.contributor.author Maksymova, Tatiana I.
dc.contributor.author Моісеєнко, Наталя Володимирівна
dc.contributor.author Соловйов, Володимир Миколайович
dc.date.accessioned 2017-07-09T18:42:49Z
dc.date.available 2017-07-09T18:42:49Z
dc.date.issued 2003
dc.identifier.citation Kiv A. E. High-temperature configurations of dimers in Si (001) surface layers / A. E. Kiv, T. I. Maksymova, N. V. Moiseenko, V. N. Soloviev // Semiconductor Physics, Quantum Electronics & Optoelectronics. – 2003. – V. 6, N. 1. – Pp. 14-18. uk
dc.identifier.uri http://elibrary.kdpu.edu.ua/handle/0564/1034
dc.identifier.uri https://doi.org/10.15407/spqeo6.01.014
dc.description 1. Hamers R.J., Tromp R. M., and Demuth J.E. Phys. Rev. B34, 5343 (1986). 2. Tabeta T., Aruga T. and M urata U. Surf. Sci. 179, L63 (1987). 3. Dabrowski J. and Scheffler M. Appl. Surf. Sci. 15, p. 58-56 (1992). 4. Gruko J. and Allen R. E. Uliramicroscopy 793, p. 42-44 (1992). 5. Abraham F.F. and Batra I.P. Surf. Sci., 163, L752 (1985). 6. Kiv A.E., Maximova T.I. and Soloviev V.N. MD simulation of the ion-stimulated processes in Si surface layers, in M.-I. Baraton and I.V. Uvarova (eds), Functional Gradient Materials and Surface Layers Preparated by Fine Particles (2001). 7. Kiv A.E., Soloviev V.N., Maximova T.I. Microstructure of the Relaxed (001) Si surface, Semiconductor Physics, Quantum electronics&Optoelectronics 3, 195-200 (2000). 8. Jacobs P.W., Kiv A.E., Balabay R.M., Grischenko N.V. Atomic configurations in a-Si obtained by ion implantation, CM&NT 2, p. 15-20 (1998). 9. Eguchi H., Tsumuraya K., Nagano T., Kihara S. Materials Transitions, JIM, 40, 1198 (1999). 10. Pearson C., Borovsky B., Krueger M., Curtis R. and Ganz E. Phys. Rev. Lett. 74, 2710 (1995). 11. Borovsky B. Krueger M., Ganz E. Phys. Rev. Lett 22, 4229 (1997). 12. Frenkel Daan and Smit Berend Understanding Molecular Simulation, Academic Press, New-York (1966). 13. Borovsky B., Krueger M., Ganz E. Phys. Rev. B59, 1598 (1999).
dc.description.abstract Molecular Dynamics (MD) simulation of Si (001) surface layers was performed. In the modified algorithm of MD the potential is corrected on each step of calculation. The corrections account the re-hybridization of chemical bonds in relaxation processes. It was found that the high-temperature relaxation of Si surface layers leads to formation of Quasi- Disordered Phase (QDP). QDP is spread from the first layer up to the forth-fifth layer. In all these layers dimers are formed. Their characteristics (length distribution and space orientation) change from layer to layer. They differ significantly from dimers formed at lower temperatures. uk
dc.language.iso en uk
dc.subject silicon surface uk
dc.subject molecular dynamics simulation uk
dc.subject quasi-disordered phase uk
dc.title High-temperature configurations of dimers in Si (001) surface layers uk
dc.type Article uk


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