Description:
1. G. P. Srivastova, Rep. Prog. Phys, 60, N5 pp. 561-613 (1997).
2. F. Bechstedt, R. Enderline, Semiconductor Surfaces and
Interfaces (Their Atomic and Electronic Structures),
Akademie-Verlag, Berlin (1988).
3. F. F. Abraham, I. P. Batra, Surf Sci. 163, L752-L758 (1985)
4. Z. M. Khakimov. Computer Mater. Sci.3 (1), pp. 94-108
(1994).
5. I. P. Lisovskyy, V.G. Litovchenko, W. Fussel, A. E. Kiv,
Intern. Conf. on POLYSE 2000.
6. P. X. Zhang, I. V. Mitchell, B. Y. Tong et al, Phys. Rev, B 50
(23) pp. 17080-17084, (1994).
7. L. J. Huang, W. M. Lau, H. T. Tang et al, Phys. Rev, B 50
(24) pp.18453-18468, (1994).
8. F. H. Stillinger, T. A .Weber, Phys Rev, B 31 (2) pp. 5262-
5267, (1984)
9. P.W. Jacobs, A.E. Kiv, R.M. Balabay et al, Computer
Modelling&New Technologies, 3 (1), p.15-21, (1998)
10. Farid F. Abraham, Inder P. Batra, Surface Sci. Lett. 163 (2),
L752, (1985).
11. J. Dabrovski, M. Scheffler, Appl. Surf. Sci. 56-58 (1), pp. 15-
22, (1992).
12. Y. S. Vavilov, A. E. Kiv, O. R. Niyazova, Mechanisms of
formation and migration of defects in semiconductors, Nauka,
M., 1981.
13. A. E. Kiv, V. N. Soloviev, Phys. Stat. Sol. (b), 94, pp. k91-
k95, (1979), (in Russian).
14. Ivor Brodie and Julius J. Muray, The Physics of
Microfabrication, Chap 5, Plenum Press, New York and
London, (1982)
15. L.S.O. Johansson, R.I.G. Uhrberg, P. Martensson and G. V.
Hansson, Phys. Rev, B42 (1), pp. 1305-1310, (1990)
